[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/McCluskeyB81>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saied_Bozorgui-Nesbat>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.1981.1675717>
foaf:homepage <https://doi.org/10.1109/TC.1981.1675717>
dc:identifier DBLP journals/tc/McCluskeyB81 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.1981.1675717 (xsd:string)
dcterms:issued 1981 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Design for Autonomous Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saied_Bozorgui-Nesbat>
swrc:number 11 (xsd:string)
swrc:pages 866-875 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/McCluskeyB81/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/McCluskeyB81>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc30.html#McCluskeyB81>
rdfs:seeAlso <https://doi.org/10.1109/TC.1981.1675717>
dc:subject VLSI testing, Built-in test, CMOS testing, design for testability, exhaustive testing, partitioning, self-test, signature analysis, stuck- open faults, test pattern generation (xsd:string)
dc:title Design for Autonomous Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 30 (xsd:string)