Predicting Defect-Tolerant Yield in the Embedded Core Context.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/MeyerP03
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http://dblp.uni-trier.de/rec/bibtex/journals/tc/MeyerP03
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dc:
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https://dblp.l3s.de/d2r/resource/authors/Fred_J._Meyer
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https://dblp.l3s.de/d2r/resource/authors/Nohpill_Park
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foaf:
homepage
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http://dx.doi.org/doi.org%2F10.1109%2FTC.2003.1244944
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DBLP journals/tc/MeyerP03
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2003
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Predicting Defect-Tolerant Yield in the Embedded Core Context.
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11
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1470-1479
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https://doi.org/10.1109/TC.2003.1244944
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dc:
subject
Yield, defect tolerance, integrated circuit, embedded core.
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dc:
title
Predicting Defect-Tolerant Yield in the Embedded Core Context.
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