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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/PomeranzR04b>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.2004.118>
foaf:homepage <https://doi.org/10.1109/TC.2004.118>
dc:identifier DBLP journals/tc/PomeranzR04b (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.2004.118 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Static Test Compaction for Full-Scan Circuits Based on Combinational Test Sets and Nonscan Input Sequences and a Lower Bound on the Number of Tests. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
swrc:number 12 (xsd:string)
swrc:pages 1569-1581 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/PomeranzR04b/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/PomeranzR04b>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc53.html#PomeranzR04b>
rdfs:seeAlso <https://doi.org/10.1109/TC.2004.118>
dc:subject Scan circuits, static test compaction, test application time. (xsd:string)
dc:title Static Test Compaction for Full-Scan Circuits Based on Combinational Test Sets and Nonscan Input Sequences and a Lower Bound on the Number of Tests. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 53 (xsd:string)