On Generating Tests that Avoid the Detection of Redundant Faults in Synchronous Sequential Circuits with Full Scan.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/PomeranzR06
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2006
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On Generating Tests that Avoid the Detection of Redundant Faults in Synchronous Sequential Circuits with Full Scan.
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491-495
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dc:
subject
Design-for-testability, fault dominance, full-scan, overtesting, redundant faults, synchronous sequential circuits, test generation.
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dc:
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On Generating Tests that Avoid the Detection of Redundant Faults in Synchronous Sequential Circuits with Full Scan.
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