Design of Totally Self-Checking Circuits with an Unrestricted Stuck-At Fault-Set Using Redundancy in Space and Time Domains.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/RaoB83
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DOI doi.org%2F10.1109%2FTC.1983.1676257
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1983
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Design of Totally Self-Checking Circuits with an Unrestricted Stuck-At Fault-Set Using Redundancy in Space and Time Domains.
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5
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464-475
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dc:
subject
time domain redundancy, CMOS, combinatorial logic, multiple faults, self-checking circuits, self-dual function, space domain redundancy
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Design of Totally Self-Checking Circuits with an Unrestricted Stuck-At Fault-Set Using Redundancy in Space and Time Domains.
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