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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/ReddyB90>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._L._Narasimha_Reddy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Prithviraj_Banerjee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.59860>
foaf:homepage <https://doi.org/10.1109/12.59860>
dc:identifier DBLP journals/tc/ReddyB90 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.59860 (xsd:string)
dcterms:issued 1990 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Algorithms-Based Fault Detection for Signal Processing Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._L._Narasimha_Reddy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Prithviraj_Banerjee>
swrc:number 10 (xsd:string)
swrc:pages 1304-1308 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/ReddyB90/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/ReddyB90>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc39.html#ReddyB90>
rdfs:seeAlso <https://doi.org/10.1109/12.59860>
dc:subject algorithm based fault detection; FFT factorization; correctness checking; roundoff errors; truncation errors; signal processing applications; special-purpose array processors; functional-level concurrent error-detection; VLSI signal processing architectures; QR factorization; finite-precision arithmetic; error coverage; digital signal processing chips; error detection; fault tolerant computing; integrated circuit testing; VLSI. (xsd:string)
dc:title Algorithms-Based Fault Detection for Signal Processing Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 39 (xsd:string)