A Data Compression Technique for Built-In Self-Test.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/ReddySK88
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https://dblp.l3s.de/d2r/resource/authors/Mark_G._Karpovsky
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https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy
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DBLP journals/tc/ReddySK88
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DOI doi.org%2F10.1109%2F12.2271
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1988
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A Data Compression Technique for Built-In Self-Test.
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9
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1151-1156
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dc:
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fault analysis; data compression technique; built-in self-test; error-propagating space compression; Exclusive-OR; Exclusive-NOR; self-testing; BIST; automatic testing; data compression; logic testing.
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A Data Compression Technique for Built-In Self-Test.
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37
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