An Easily Testable Design of Programmable Logic Arrays for Multiple Faults.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/SalujaKF83
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1983
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An Easily Testable Design of Programmable Logic Arrays for Multiple Faults.
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11
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1038-1046
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dc:
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stuck-type faults, Cross-point faults, easily testable design, multiple faults, programmable logic arrays
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An Easily Testable Design of Programmable Logic Arrays for Multiple Faults.
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