The Bidirectional Double Latch (BDDL).
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/Savir86
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tc/Savir86
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dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir
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foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTC.1986.1676659
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foaf:
homepage
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dc:
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DBLP journals/tc/Savir86
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dc:
identifier
DOI doi.org%2F10.1109%2FTC.1986.1676659
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dcterms:
issued
1986
(xsd:gYear)
swrc:
journal
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https://dblp.l3s.de/d2r/resource/journals/tc
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rdfs:
label
The Bidirectional Double Latch (BDDL).
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir
>
swrc:
number
1
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swrc:
pages
65-66
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owl:
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http://bibsonomy.org/uri/bibtexkey/journals/tc/Savir86/dblp
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http://dblp.rkbexplorer.com/id/journals/tc/Savir86
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rdfs:
seeAlso
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http://dblp.uni-trier.de/db/journals/tc/tc35.html#Savir86
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rdfs:
seeAlso
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https://doi.org/10.1109/TC.1986.1676659
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dc:
subject
shift register latch, Design for testability, hardware overhead, LSSD, shift register failure diagnostics
(xsd:string)
dc:
title
The Bidirectional Double Latch (BDDL).
(xsd:string)
dc:
type
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type
swrc:Article
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foaf:Document
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35
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