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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/SavirM88>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/William_H._McAnney>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.2166>
foaf:homepage <https://doi.org/10.1109/12.2166>
dc:identifier DBLP journals/tc/SavirM88 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.2166 (xsd:string)
dcterms:issued 1988 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Random Pattern Testability of Delay Faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/William_H._McAnney>
swrc:number 3 (xsd:string)
swrc:pages 291-300 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/SavirM88/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/SavirM88>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc37.html#SavirM88>
rdfs:seeAlso <https://doi.org/10.1109/12.2166>
dc:subject random pattern testability; delay faults; combinational logic networks; latches; system clocks; combinatorial circuits; logic testing. (xsd:string)
dc:title Random Pattern Testability of Delay Faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 37 (xsd:string)