Testing for Coupled Cells in Random-Access Memories.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/SavirMV91
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tc/SavirMV91
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Salvatore_R._Vecchio
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/William_H._McAnney
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F12.93752
>
foaf:
homepage
<
https://doi.org/10.1109/12.93752
>
dc:
identifier
DBLP journals/tc/SavirMV91
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2F12.93752
(xsd:string)
dcterms:
issued
1991
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tc
>
rdfs:
label
Testing for Coupled Cells in Random-Access Memories.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Salvatore_R._Vecchio
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/William_H._McAnney
>
swrc:
number
10
(xsd:string)
swrc:
pages
1177-1180
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tc/SavirMV91/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tc/SavirMV91
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tc/tc40.html#SavirMV91
>
rdfs:
seeAlso
<
https://doi.org/10.1109/12.93752
>
dc:
subject
RAM; random-access memories; memory testing; coupled-cell faults; address lines; read/write control; address space; deterministic setting; automatic testing; fault tolerant computing; integrated circuit testing; integrated memory circuits; random-access storage.
(xsd:string)
dc:
title
Testing for Coupled Cells in Random-Access Memories.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
40
(xsd:string)