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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/ShenS88>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li_Shen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stephen_Y._H._Su>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.5992>
foaf:homepage <https://doi.org/10.1109/12.5992>
dc:identifier DBLP journals/tc/ShenS88 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.5992 (xsd:string)
dcterms:issued 1988 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label A Functional Testing Method for Microprocessors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li_Shen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stephen_Y._H._Su>
swrc:number 10 (xsd:string)
swrc:pages 1288-1293 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/ShenS88/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/ShenS88>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc37.html#ShenS88>
rdfs:seeAlso <https://doi.org/10.1109/12.5992>
dc:subject functional testing method; microprocessors; control fault model; register transfer language; testing requirements; k-out-of-m codes; test generation time; computer testing; microprocessor chips. (xsd:string)
dc:title A Functional Testing Method for Microprocessors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 37 (xsd:string)