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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/SoufiSDK95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/F._Darlay>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Soufi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yvon_Savaria>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.467701>
foaf:homepage <https://doi.org/10.1109/12.467701>
dc:identifier DBLP journals/tc/SoufiSDK95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.467701 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/F._Darlay>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Soufi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yvon_Savaria>
swrc:number 10 (xsd:string)
swrc:pages 1251-1256 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/SoufiSDK95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/SoufiSDK95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc44.html#SoufiSDK95>
rdfs:seeAlso <https://doi.org/10.1109/12.467701>
dc:subject Built-in self-testing, full reset, partial reset, initialization of sequential circuits, pseudorandom testing, modelization of sequential circuits, Markov chain processes, testability measures. (xsd:string)
dc:title Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 44 (xsd:string)