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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/StapperL92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Charles_H._Stapper>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hsing-San_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.165390>
foaf:homepage <https://doi.org/10.1109/12.165390>
dc:identifier DBLP journals/tc/StapperL92 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.165390 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Synergistic Fault-Tolerance for Memory Chips. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Charles_H._Stapper>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hsing-San_Lee>
swrc:number 9 (xsd:string)
swrc:pages 1078-1087 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/StapperL92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/StapperL92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc41.html#StapperL92>
rdfs:seeAlso <https://doi.org/10.1109/12.165390>
dc:subject bitline redundancy; memory chips; synergistic fault tolerance; VLSI memory chip; error-correction; error-correcting codes; redundant circuits; wordline redundancy; fault-tolerance synergism; DRAM chips; error correction codes; fault tolerant computing; VLSI. (xsd:string)
dc:title Synergistic Fault-Tolerance for Memory Chips. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 41 (xsd:string)