Design and Application of Self-Testing Comparators Implemented with MOS PLA's.
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1984
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Design and Application of Self-Testing Comparators Implemented with MOS PLA's.
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493-506
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dc:
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two-rail code checker, Concurrent error detection, duplication and matching, faults in VLSI circuits, MOS PLA fault model, programmable logic array, self-testing comparator
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Design and Application of Self-Testing Comparators Implemented with MOS PLA's.
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