Exhaustive Test Pattern Generation with Constant Weight Vectors.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tc/TangW83
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tc/TangW83
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Donald_T._Tang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Lin_S._Woo
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTC.1983.1676175
>
foaf:
homepage
<
https://doi.org/10.1109/TC.1983.1676175
>
dc:
identifier
DBLP journals/tc/TangW83
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTC.1983.1676175
(xsd:string)
dcterms:
issued
1983
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tc
>
rdfs:
label
Exhaustive Test Pattern Generation with Constant Weight Vectors.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Donald_T._Tang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Lin_S._Woo
>
swrc:
number
12
(xsd:string)
swrc:
pages
1145-1150
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tc/TangW83/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tc/TangW83
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tc/tc32.html#TangW83
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TC.1983.1676175
>
dc:
subject
VLSI testing, Constant weight codes, exhaustive testing, fault testing, logic testing, multilevel logic, scan path, self-testing, test pattern generation
(xsd:string)
dc:
title
Exhaustive Test Pattern Generation with Constant Weight Vectors.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
32
(xsd:string)