[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/TangW83>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donald_T._Tang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lin_S._Woo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.1983.1676175>
foaf:homepage <https://doi.org/10.1109/TC.1983.1676175>
dc:identifier DBLP journals/tc/TangW83 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.1983.1676175 (xsd:string)
dcterms:issued 1983 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Exhaustive Test Pattern Generation with Constant Weight Vectors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donald_T._Tang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lin_S._Woo>
swrc:number 12 (xsd:string)
swrc:pages 1145-1150 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/TangW83/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/TangW83>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc32.html#TangW83>
rdfs:seeAlso <https://doi.org/10.1109/TC.1983.1676175>
dc:subject VLSI testing, Constant weight codes, exhaustive testing, fault testing, logic testing, multilevel logic, scan path, self-testing, test pattern generation (xsd:string)
dc:title Exhaustive Test Pattern Generation with Constant Weight Vectors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 32 (xsd:string)