An ALU-Based BIST Scheme for Word-Organized RAMs. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/tc/Voyiatzis08>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Ioannis_Voyiatzis>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FTC.2007.70835>
foaf:homepage	<https://doi.org/10.1109/TC.2007.70835>
dc:identifier	DBLP journals/tc/Voyiatzis08 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FTC.2007.70835 (xsd:string)
dcterms:issued	2008 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label	An ALU-Based BIST Scheme for Word-Organized RAMs. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Ioannis_Voyiatzis>
swrc:number	5 (xsd:string)
swrc:pages	577-590 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/tc/Voyiatzis08/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/tc/Voyiatzis08>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/tc/tc57.html#Voyiatzis08>
rdfs:seeAlso	<https://doi.org/10.1109/TC.2007.70835>
dc:subject	Semiconductor Memories, Reliability, Testing and Fault-Tolerance, Test generation, Built-In Tests, Memory control and access (xsd:string)
dc:title	An ALU-Based BIST Scheme for Word-Organized RAMs. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	57 (xsd:string)