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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/XiangXF03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong_Xiang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yi_Xu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTC.2003.1223640>
foaf:homepage <https://doi.org/10.1109/TC.2003.1223640>
dc:identifier DBLP journals/tc/XiangXF03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTC.2003.1223640 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong_Xiang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yi_Xu>
swrc:number 8 (xsd:string)
swrc:pages 1063-1075 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/XiangXF03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/XiangXF03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc52.html#XiangXF03>
rdfs:seeAlso <https://doi.org/10.1109/TC.2003.1223640>
dc:subject Conflict, inversion parity, nonscan design for testability, partial scan design, sequential depth for testability, testability measure. (xsd:string)
dc:title Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 52 (xsd:string)