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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tc/XiaoqingK92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoqing_Wen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F12.142692>
foaf:homepage <https://doi.org/10.1109/12.142692>
dc:identifier DBLP journals/tc/XiaoqingK92 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F12.142692 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tc>
rdfs:label A Testable Design of Logic Circuits under Highly Observable Condition. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoqing_Wen>
swrc:number 5 (xsd:string)
swrc:pages 654-659 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tc/XiaoqingK92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tc/XiaoqingK92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tc/tc41.html#XiaoqingK92>
rdfs:seeAlso <https://doi.org/10.1109/12.142692>
dc:subject testable design; logic circuits; highly observable condition; stuck-at faults; stuck-open faults; combinational circuit; combinatorial circuits; fault tolerant computing; integrated circuit testing; integrated logic circuits; logic testing. (xsd:string)
dc:title A Testable Design of Logic Circuits under Highly Observable Condition. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 41 (xsd:string)