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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/AlawiehWL18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fa_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Baker_Alawieh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xin_Li_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2017.2729469>
foaf:homepage <https://doi.org/10.1109/TCAD.2017.2729469>
dc:identifier DBLP journals/tcad/AlawiehWL18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2017.2729469 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fa_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Baker_Alawieh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xin_Li_0001>
swrc:number 4 (xsd:string)
swrc:pages 832-844 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/AlawiehWL18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/AlawiehWL18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad37.html#AlawiehWL18>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2017.2729469>
dc:title Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 37 (xsd:string)