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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/AmyeenFPB03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Enamul_Amyeen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vamsi_Boppana>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._Kent_Fuchs>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2003.814241>
foaf:homepage <https://doi.org/10.1109/TCAD.2003.814241>
dc:identifier DBLP journals/tcad/AmyeenFPB03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2003.814241 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Fault equivalence identification in combinational circuits using implication and evaluation techniques. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Enamul_Amyeen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vamsi_Boppana>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._Kent_Fuchs>
swrc:number 7 (xsd:string)
swrc:pages 922-936 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/AmyeenFPB03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/AmyeenFPB03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad22.html#AmyeenFPB03>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2003.814241>
dc:title Fault equivalence identification in combinational circuits using implication and evaluation techniques. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)