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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/BaharSNG05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hui-Yuan_Song>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joel_Grodstein>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kundan_Nepal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Iris_Bahar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2005.844105>
foaf:homepage <https://doi.org/10.1109/TCAD.2005.844105>
dc:identifier DBLP journals/tcad/BaharSNG05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2005.844105 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hui-Yuan_Song>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joel_Grodstein>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kundan_Nepal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Iris_Bahar>
swrc:number 4 (xsd:string)
swrc:pages 502-515 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/BaharSNG05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/BaharSNG05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad24.html#BaharSNG05>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2005.844105>
dc:title Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)