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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/BaiD04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sujit_Dey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoliang_Bai>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2004.833612>
foaf:homepage <https://doi.org/10.1109/TCAD.2004.833612>
dc:identifier DBLP journals/tcad/BaiD04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2004.833612 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label High-level crosstalk defect Simulation methodology for system-on-chip interconnects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sujit_Dey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoliang_Bai>
swrc:number 9 (xsd:string)
swrc:pages 1355-1361 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/BaiD04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/BaiD04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad23.html#BaiD04>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2004.833612>
dc:title High-level crosstalk defect Simulation methodology for system-on-chip interconnects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 23 (xsd:string)