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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/ChakravartyR90>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._S._Ravi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sreejit_Chakravarty>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.46808>
foaf:homepage <https://doi.org/10.1109/43.46808>
dc:identifier DBLP journals/tcad/ChakravartyR90 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.46808 (xsd:string)
dcterms:issued 1990 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Computing optimal test sequences from complete test sets for stuck-open faults in CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._S._Ravi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sreejit_Chakravarty>
swrc:number 3 (xsd:string)
swrc:pages 329-331 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/ChakravartyR90/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/ChakravartyR90>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad9.html#ChakravartyR90>
rdfs:seeAlso <https://doi.org/10.1109/43.46808>
dc:title Computing optimal test sequences from complete test sets for stuck-open faults in CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 9 (xsd:string)