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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/ChenG96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Ang_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.552090>
foaf:homepage <https://doi.org/10.1109/43.552090>
dc:identifier DBLP journals/tcad/ChenG96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.552090 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Design of efficient BIST test pattern generators for delay testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Ang_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta>
swrc:number 12 (xsd:string)
swrc:pages 1568-1575 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/ChenG96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/ChenG96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad15.html#ChenG96>
rdfs:seeAlso <https://doi.org/10.1109/43.552090>
dc:title Design of efficient BIST test pattern generators for delay testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 15 (xsd:string)