Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tcad/ChengTW02
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tcad/ChengTW02
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kuo-Liang_Cheng
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ming-Fu_Tsai
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2002.804101
>
foaf:
homepage
<
https://doi.org/10.1109/TCAD.2002.804101
>
dc:
identifier
DBLP journals/tcad/ChengTW02
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTCAD.2002.804101
(xsd:string)
dcterms:
issued
2002
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tcad
>
rdfs:
label
Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kuo-Liang_Cheng
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ming-Fu_Tsai
>
swrc:
number
11
(xsd:string)
swrc:
pages
1328-1336
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tcad/ChengTW02/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tcad/ChengTW02
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tcad/tcad21.html#ChengTW02
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TCAD.2002.804101
>
dc:
title
Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
21
(xsd:string)