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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/ChoiM06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Linda_S._Milor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Munkang_Choi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2005.855963>
foaf:homepage <https://doi.org/10.1109/TCAD.2005.855963>
dc:identifier DBLP journals/tcad/ChoiM06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2005.855963 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Impact on circuit performance of deterministic within-die variation in nanoscale semiconductor manufacturing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Linda_S._Milor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Munkang_Choi>
swrc:number 7 (xsd:string)
swrc:pages 1350-1367 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/ChoiM06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/ChoiM06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#ChoiM06>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2005.855963>
dc:title Impact on circuit performance of deterministic within-die variation in nanoscale semiconductor manufacturing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 25 (xsd:string)