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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/EslahiAMK20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dhawal_Mahajan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hossein_Eslahi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sayed_Ali_Albahrani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sourabh_Khandelwal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2019.2952554>
foaf:homepage <https://doi.org/10.1109/TCAD.2019.2952554>
dc:identifier DBLP journals/tcad/EslahiAMK20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2019.2952554 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power Amplifiers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dhawal_Mahajan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hossein_Eslahi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sayed_Ali_Albahrani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sourabh_Khandelwal>
swrc:number 10 (xsd:string)
swrc:pages 2000-2005 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/EslahiAMK20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/EslahiAMK20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad39.html#EslahiAMK20>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2019.2952554>
dc:title An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power Amplifiers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 39 (xsd:string)