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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/FavalliOR92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruno_Ricc%E2%88%9A%E2%89%A4>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michele_Favalli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Piero_Olivo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.177408>
foaf:homepage <https://doi.org/10.1109/43.177408>
dc:identifier DBLP journals/tcad/FavalliOR92 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.177408 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label A probabilistic fault model for 'analog' faults in digital CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruno_Ricc%E2%88%9A%E2%89%A4>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michele_Favalli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Piero_Olivo>
swrc:number 11 (xsd:string)
swrc:pages 1459-1462 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/FavalliOR92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/FavalliOR92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad11.html#FavalliOR92>
rdfs:seeAlso <https://doi.org/10.1109/43.177408>
dc:title A probabilistic fault model for 'analog' faults in digital CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 11 (xsd:string)