A Novel Delay Fault Testing Methodology Using Low-Overhead Built-In Delay Sensor.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tcad/GhoshBRR06
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A Novel Delay Fault Testing Methodology Using Low-Overhead Built-In Delay Sensor.
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A Novel Delay Fault Testing Methodology Using Low-Overhead Built-In Delay Sensor.
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