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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/GlaserV96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heinrich_Theodor_Vierhaus>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Uwe_Gl%E2%88%9A%C2%A7ser>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.494704>
foaf:homepage <https://doi.org/10.1109/43.494704>
dc:identifier DBLP journals/tcad/GlaserV96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.494704 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Mixed level test generation for synchronous sequential circuits using the FOGBUSTER algorithm. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heinrich_Theodor_Vierhaus>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Uwe_Gl%E2%88%9A%C2%A7ser>
swrc:number 4 (xsd:string)
swrc:pages 410-423 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/GlaserV96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/GlaserV96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad15.html#GlaserV96>
rdfs:seeAlso <https://doi.org/10.1109/43.494704>
dc:title Mixed level test generation for synchronous sequential circuits using the FOGBUSTER algorithm. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 15 (xsd:string)