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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/HamdiouiAGR04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mike_Rodgers>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2004.826578>
foaf:homepage <https://doi.org/10.1109/TCAD.2004.826578>
dc:identifier DBLP journals/tcad/HamdiouiAGR04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2004.826578 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mike_Rodgers>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
swrc:number 5 (xsd:string)
swrc:pages 737-757 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/HamdiouiAGR04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/HamdiouiAGR04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad23.html#HamdiouiAGR04>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2004.826578>
dc:title Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 23 (xsd:string)