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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/HuangAT98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaiyuan_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Krishnaiyan_Thulasiraman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vinod_K._Agarwal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.681263>
foaf:homepage <https://doi.org/10.1109/43.681263>
dc:identifier DBLP journals/tcad/HuangAT98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.681263 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Diagnosis of clustered faults and wafer testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaiyuan_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Krishnaiyan_Thulasiraman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vinod_K._Agarwal>
swrc:number 2 (xsd:string)
swrc:pages 136-148 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/HuangAT98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/HuangAT98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad17.html#HuangAT98>
rdfs:seeAlso <https://doi.org/10.1109/43.681263>
dc:title Diagnosis of clustered faults and wafer testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 17 (xsd:string)