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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/IvanovRRAB01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Florence_Aza%E2%88%9A%C4%AEs>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sumbal_Rafiq>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yves_Bertrand>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.905680>
foaf:homepage <https://doi.org/10.1109/43.905680>
dc:identifier DBLP journals/tcad/IvanovRRAB01 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.905680 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label On the detectability of CMOS floating gate transistor faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Florence_Aza%E2%88%9A%C4%AEs>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sumbal_Rafiq>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yves_Bertrand>
swrc:number 1 (xsd:string)
swrc:pages 116-128 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/IvanovRRAB01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/IvanovRRAB01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad20.html#IvanovRRAB01>
rdfs:seeAlso <https://doi.org/10.1109/43.905680>
dc:title On the detectability of CMOS floating gate transistor faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)