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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/JoneP95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christos_A._Papachristou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen-Ben_Jone>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.365128>
foaf:homepage <https://doi.org/10.1109/43.365128>
dc:identifier DBLP journals/tcad/JoneP95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.365128 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label A coordinated circuit partitioning and test generation method for pseudo-exhaustive testing of VLSI circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christos_A._Papachristou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen-Ben_Jone>
swrc:number 3 (xsd:string)
swrc:pages 374-384 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/JoneP95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/JoneP95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad14.html#JoneP95>
rdfs:seeAlso <https://doi.org/10.1109/43.365128>
dc:title A coordinated circuit partitioning and test generation method for pseudo-exhaustive testing of VLSI circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 14 (xsd:string)