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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/KimAS05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yong_Chang_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2005.847894>
foaf:homepage <https://doi.org/10.1109/TCAD.2005.847894>
dc:identifier DBLP journals/tcad/KimAS05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2005.847894 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Combinational automatic test pattern generation for acyclic sequential circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yong_Chang_Kim>
swrc:number 6 (xsd:string)
swrc:pages 948-956 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/KimAS05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/KimAS05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad24.html#KimAS05>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2005.847894>
dc:title Combinational automatic test pattern generation for acyclic sequential circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)