[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/KimC99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tom_Chen_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Von-Kyoung_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.806812>
foaf:homepage <https://doi.org/10.1109/43.806812>
dc:identifier DBLP journals/tcad/KimC99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.806812 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label On comparing functional fault coverage and defect coverage for memory testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tom_Chen_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Von-Kyoung_Kim>
swrc:number 11 (xsd:string)
swrc:pages 1676-1683 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/KimC99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/KimC99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad18.html#KimC99>
rdfs:seeAlso <https://doi.org/10.1109/43.806812>
dc:title On comparing functional fault coverage and defect coverage for memory testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 18 (xsd:string)