Pattern generation for delay testing and dynamic timing analysisconsidering power-supply noise effects.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tcad/KrsticJC01
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dcterms:
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dcterms:
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2001
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Pattern generation for delay testing and dynamic timing analysisconsidering power-supply noise effects.
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3
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swrc:
pages
416-425
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Pattern generation for delay testing and dynamic timing analysisconsidering power-supply noise effects.
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