[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/LiM05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chien-Mo_James_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2005.852457>
foaf:homepage <https://doi.org/10.1109/TCAD.2005.852457>
dc:identifier DBLP journals/tcad/LiM05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2005.852457 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chien-Mo_James_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edward_J._McCluskey>
swrc:number 11 (xsd:string)
swrc:pages 1748-1759 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/LiM05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/LiM05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad24.html#LiM05>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2005.852457>
dc:title Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)