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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/LinHLSKFHGM14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donald_S._Gardner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eswaran_S>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Farzan_Fallah>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nagib_Hakim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sharad_Kumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ted_Hong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yanjing_Li>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2014.2334301>
foaf:homepage <https://doi.org/10.1109/TCAD.2014.2334301>
dc:identifier DBLP journals/tcad/LinHLSKFHGM14 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2014.2334301 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donald_S._Gardner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eswaran_S>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Farzan_Fallah>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nagib_Hakim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sharad_Kumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ted_Hong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yanjing_Li>
swrc:number 10 (xsd:string)
swrc:pages 1573-1590 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/LinHLSKFHGM14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/LinHLSKFHGM14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad33.html#LinHLSKFHGM14>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2014.2334301>
dc:title Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 33 (xsd:string)