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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/LiouKJC03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Angela_Krstic>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jing-Jia_Liou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yi-Min_Jiang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2003.811442>
foaf:homepage <https://doi.org/10.1109/TCAD.2003.811442>
dc:identifier DBLP journals/tcad/LiouKJC03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2003.811442 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Angela_Krstic>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jing-Jia_Liou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yi-Min_Jiang>
swrc:number 6 (xsd:string)
swrc:pages 756-769 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/LiouKJC03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/LiouKJC03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad22.html#LiouKJC03>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2003.811442>
dc:title Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)