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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/MaityRG21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chandan_Giri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dilip_Kumar_Maity>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Surajit_Kumar_Roy>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2020.3021341>
foaf:homepage <https://doi.org/10.1109/TCAD.2020.3021341>
dc:identifier DBLP journals/tcad/MaityRG21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2020.3021341 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label TSV-Cluster Defect Tolerance Using Tree-Based Redundancy for Yield Improvement of 3-D ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chandan_Giri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dilip_Kumar_Maity>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Surajit_Kumar_Roy>
swrc:number 8 (xsd:string)
swrc:pages 1500-1510 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/MaityRG21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/MaityRG21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad40.html#MaityRG21>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2020.3021341>
dc:title TSV-Cluster Defect Tolerance Using Tree-Based Redundancy for Yield Improvement of 3-D ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 40 (xsd:string)