Modeling and Analysis of Leakage Currents in Double-Gate Technologies.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tcad/MukhopadhyayKCR06
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tcad/MukhopadhyayKCR06
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ching-Te_Chuang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Keunwoo_Kim
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Saibal_Mukhopadhyay
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2006.873892
>
foaf:
homepage
<
https://doi.org/10.1109/TCAD.2006.873892
>
dc:
identifier
DBLP journals/tcad/MukhopadhyayKCR06
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTCAD.2006.873892
(xsd:string)
dcterms:
issued
2006
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tcad
>
rdfs:
label
Modeling and Analysis of Leakage Currents in Double-Gate Technologies.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ching-Te_Chuang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Keunwoo_Kim
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Saibal_Mukhopadhyay
>
swrc:
number
10
(xsd:string)
swrc:
pages
2052-2061
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tcad/MukhopadhyayKCR06/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tcad/MukhopadhyayKCR06
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#MukhopadhyayKCR06
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TCAD.2006.873892
>
dc:
title
Modeling and Analysis of Leakage Currents in Double-Gate Technologies.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
25
(xsd:string)