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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/MukhopadhyayMR05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hamid_Mahmoodi-Meimand>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saibal_Mukhopadhyay>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2005.852295>
foaf:homepage <https://doi.org/10.1109/TCAD.2005.852295>
dc:identifier DBLP journals/tcad/MukhopadhyayMR05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2005.852295 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hamid_Mahmoodi-Meimand>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saibal_Mukhopadhyay>
swrc:number 12 (xsd:string)
swrc:pages 1859-1880 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/MukhopadhyayMR05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/MukhopadhyayMR05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad24.html#MukhopadhyayMR05>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2005.852295>
dc:title Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)