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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/NassifSD86>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andrzej_J._Strojwas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sani_R._Nassif>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stephen_W._Director>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.1986.1270181>
foaf:homepage <https://doi.org/10.1109/TCAD.1986.1270181>
dc:identifier DBLP journals/tcad/NassifSD86 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.1986.1270181 (xsd:string)
dcterms:issued 1986 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label A Methodology for Worst-Case Analysis of Integrated Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andrzej_J._Strojwas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sani_R._Nassif>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stephen_W._Director>
swrc:number 1 (xsd:string)
swrc:pages 104-113 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/NassifSD86/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/NassifSD86>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad5.html#NassifSD86>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.1986.1270181>
dc:title A Methodology for Worst-Case Analysis of Integrated Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 5 (xsd:string)