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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/ParkM92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eun_Sei_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Ray_Mercer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.144857>
foaf:homepage <https://doi.org/10.1109/43.144857>
dc:identifier DBLP journals/tcad/ParkM92 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.144857 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label An efficient delay test generation system for combinational logic circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eun_Sei_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Ray_Mercer>
swrc:number 7 (xsd:string)
swrc:pages 926-938 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/ParkM92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/ParkM92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad11.html#ParkM92>
rdfs:seeAlso <https://doi.org/10.1109/43.144857>
dc:title An efficient delay test generation system for combinational logic circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 11 (xsd:string)