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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/RangavajjhalaBK93>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bharat_L._Bhuva>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sherra_E._Kerns>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Venkata_S._Rangavajjhala>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F43.229759>
foaf:homepage <https://doi.org/10.1109/43.229759>
dc:identifier DBLP journals/tcad/RangavajjhalaBK93 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F43.229759 (xsd:string)
dcterms:issued 1993 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Statistical degradation analysis of digital CMOS IC's. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bharat_L._Bhuva>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sherra_E._Kerns>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Venkata_S._Rangavajjhala>
swrc:number 6 (xsd:string)
swrc:pages 837-844 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/RangavajjhalaBK93/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/RangavajjhalaBK93>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad12.html#RangavajjhalaBK93>
rdfs:seeAlso <https://doi.org/10.1109/43.229759>
dc:title Statistical degradation analysis of digital CMOS IC's. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 12 (xsd:string)