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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/SeomunKS08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jae-Hyun_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Seomun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Youngsoo_Shin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2008.2006084>
foaf:homepage <https://doi.org/10.1109/TCAD.2008.2006084>
dc:identifier DBLP journals/tcad/SeomunKS08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2008.2006084 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Skewed Flip-Flop and Mixed-Vt Gates for Minimizing Leakage in Sequential Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jae-Hyun_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Seomun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Youngsoo_Shin>
swrc:number 11 (xsd:string)
swrc:pages 1956-1968 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/SeomunKS08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/SeomunKS08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad27.html#SeomunKS08>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2008.2006084>
dc:title Skewed Flip-Flop and Mixed-Vt Gates for Minimizing Leakage in Sequential Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 27 (xsd:string)