Conditionally robust two-pattern tests and CMOS design for testability.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tcad/SherlekarS88
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tcad/SherlekarS88
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/P._S._Subramanian
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sunil_D._Sherlekar
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F43.3165
>
foaf:
homepage
<
https://doi.org/10.1109/43.3165
>
dc:
identifier
DBLP journals/tcad/SherlekarS88
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2F43.3165
(xsd:string)
dcterms:
issued
1988
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tcad
>
rdfs:
label
Conditionally robust two-pattern tests and CMOS design for testability.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/P._S._Subramanian
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sunil_D._Sherlekar
>
swrc:
number
3
(xsd:string)
swrc:
pages
325-332
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tcad/SherlekarS88/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tcad/SherlekarS88
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tcad/tcad7.html#SherlekarS88
>
rdfs:
seeAlso
<
https://doi.org/10.1109/43.3165
>
dc:
title
Conditionally robust two-pattern tests and CMOS design for testability.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
7
(xsd:string)