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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tcad/SureshK16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vikram_B._Suresh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTCAD.2015.2449236>
foaf:homepage <https://doi.org/10.1109/TCAD.2015.2449236>
dc:identifier DBLP journals/tcad/SureshK16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTCAD.2015.2449236 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tcad>
rdfs:label Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS: A Case-Study on an SRAM Array. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vikram_B._Suresh>
swrc:number 1 (xsd:string)
swrc:pages 155-165 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tcad/SureshK16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tcad/SureshK16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tcad/tcad35.html#SureshK16>
rdfs:seeAlso <https://doi.org/10.1109/TCAD.2015.2449236>
dc:title Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS: A Case-Study on an SRAM Array. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 35 (xsd:string)